22. - 25. September 1999
Smolenice castle, Slovakia
Wednesday 22. 9. 1999
| 8:30 | Bus departure from Bratislava Main Railway Station |
| 13:00 | Lunch |
| 14.00 | M. Tolan (tutorial): X-ray reflectivity from surfaces and thin films |
| 15:00 | Coffee break |
| 15:30 | Aspelmeyer: Martensitic transformations at surfaces... |
| 15:50 | Eisenschmidt: Investigation of SrBi Tantalate layers on Si |
| 16:10 | Ulyanenkov: X-ray scattering study of interfacial roughness correlation |
| 16:30 | Short break |
| 16:40 | Anopchenko: Structure-GMR relationship Ag/Co multilayers |
| 17:00 | Meduna: Diffuse X-ray reflection from SiGe/Si |
| 17:20 | Hecker: Effect of annealing on structural properties of sputtered metallic multilayers |
| 17:40 | Novikova: Characterization of small d-space multilayers... |
| 17:50 | Hanke: X-ray scattering from steps and step bunches on homoepitaxial... |
| 18:30 | Dinner |
| 20:00 | Tower party |
Thursday 23. 9. 1999
| 8:30 | T. Baumbach (tutorial): X-ray scattering from lateral nanostructures |
| 9:00 | Coffee break |
| 10:00 | Schmidtbauer: Correlation in self-assembled SiGe nanscale islands |
| 10:20 | Wiebach: Combinded FEM and Brute Force Simulations of X-ray scattering in Epitaxial Nanostructures |
| 10:40 | Darowski: HRXRD and GID of lateral wire structures |
| 11:00 | Break |
| 11:10 | Zeimer: GID and PL analysis of strain modulated quantum well nanostructures |
| 11:30 | Zhuang: HRD and GID from from etched Nanostructures |
| 11:50 | Mikulik: Coplanar and Noncoplanar X-ray reflectivity from lateral W/Si multilayer gratings |
| 12:10 | Roch: Characterization of SiGe/Si self-organized QD by HRXRD |
| 13:00 | Lunch |
| 15:00 | A. Schreyer (tutorial): X-ray and neutron scattering from thin film systems |
| 16:00 | Coffee break |
| 16:30 | Bardosova: X-ray diffraction from thin organic multilayers |
| 17:00 | Poloucek : structure analysis of Lipid-polyelectrolyte LB-Films |
| 17:20 | Mueller: Thermal denaturating of bacteriorhodopsin.... |
| 17:40 | Basu: X-ray scattering of soft matter films |
| 18:10 | Kharchenko: X-ray scattering from from spun LC-films... |
| 18:30 | Dinner |
| 20:00 | Ress (Bruker-AXS) and Kunath (Philips Industrial Electronics): Commercial presentations |
| 21:00 | Beer and wine discussion |
Friday 24. 9. 1999
| 8:30 | C. Ferrari (tutorial): Methods of strain determination in partially relaxed heterostructures |
| 9:00 | Coffee break |
| 10:00 | Bdikin: Domain structure of Yba2Cu3O7-x epitaxial thin films |
| 10:20 | Mazur: Lateral ordering in hetroepitaxial layers by HXRD |
| 10:40 | Nesterets: Investigation of semiconductor superlattices and graded layers using statistical theory of the triple crystal diffractometry |
| 10:00 | Break |
| 11:10 | Luebbert: X-ray methods to determine strain fields in semiconductor structures |
| 11:30 | Grenzer: GID strain analysis of GaAs after laterally modulated ion implantation |
| 11:50 | Daniel: Anisotropic strain relaxation in... |
| 13:00 | Lunch |
| 15:00 | H. Reichert (tutorial): X-ray diffuse scattering |
| 16:00 | Coffee break |
| 16:30 | Borowski: Orthorhombic microdifects in GaAs |
| 16:50 | Eichhorn: Thin layer studies at the material research Goniometer ROBL |
| 17:10 | Pfeiffer, F.: Thin film X-ray wave guides |
| 17:30 | Break |
| 17:30 | Pfeiffer, J.: Nucleation propagation of misfit dislocations |
| 17:50 | Makarov: Polishing of SiOx wafers |
| 18:10 | Streitel / Renner |
| 18:30 | Dinner |
| Fire, barbecue |
Saturday 25. 9. 1999
| 7:30 | Breakfast |
| 8:30 | Hiking tour |
| 11:30 | Lunch, departure |