15:00	Metin Tolan (tutorial) :  X-ray reflectometry

15.45 - 16.00     BREAK

16:00	Samolienko: On the statistical interpretation of x-ray reflectivity data fitting
16:20	Bolm: X-ray reflectivity and GID from organic multilayers
16:40	Fulthorpe: X-ray reflectivity studies of sputtered Cu/Co multilayers on etched silicon
17:00	Stangl: X-ray reflectivity from Si/Si/Ge/SiC superlattices

17:20 - 17.40     BREAK

17:40	Safronov: LB films of three-component random copolymers with chromophore groups and study by X-ray diffraction
18:00	Nefedov: High resolution X-ray scattering of thin Pt films on Sapphire
18:20	Eisenschmidt: Reflectometry at Bi/Ti layers
19:00	DINNER
20:00	GET-TOGETHER PARTY

Thursday 2. 10. 1997

7:45	BREAKFAST
8:30	Ullrich Pietsch (tutorial) :  High-resolution X-ray diffraction

9.15 - 9.30     BREAK

9:30	Thiele: Reciprocal space mapping of Si/Ge multiquantum wells
9:50	Zeimer: High-resolution XRD from buried SQW
10:10	Schaefer: Determination of the deformation tensor of ZnSe epilayers pseudomorphically grown on misoriented GaAs substrate
10:30	Dynowska: Strain relaxation of CdTe/CdMnTe and CdTe/MnTe superlattices grown by MBE on GaAs (100)

11.10 - 11.30     BREAK

11:30	ourek: High resolution X-ray diffraction by III-V semiconductor layers
11:50	Korn: Characterization of ZnSTe/ZnTe superlattices
12:10	Gerhard: Comparison of superlattices based on ZnSTe and BeTe
12:30	Haratuyunyan: X-ray diffraction investigation of the relaxation state in strained GaInAs/GaAs multilayer structures
13:00	LUNCH
15:30	Juergen Haertwig (tutorial) :  X-ray topography

16.15 - 16.30     BREAK

16:30	Ludwig: X-ray topographic analysis of dislocations in thin SIMOX layers
16:50	Markov: Surface demages revealing in chemical-mechanical polished silicon wafers by X-ray grazing incidence topography and TEM
17:10	Kinne: Image platess as detectors in high-resolution X-ray diffraction

17:30 - 17:50     BREAK

17:50	Ress: Utilization of image plates for high resolution X-ray diffraction
18:10	Eichhorn: X-ray characterization of Si implanted with MeV Ge ions
18:30	Poloucek: X-ray reflectivity from DNA monolayers
19:00	DINNER
20:00	Leszcynski: Microstructure of GaN surface, epilayers and bulk crystals
20:20	Mazur: X-ray high resolution diffraction study of the mechanical treatment related defects
20:40	Nesterents: X-ray diffraction from superlattices with microdefects and layer thickness fluctuations
21:00	WINE PARTY

Friday 3. 10. 1997

7:45	BREAKFAST
8:30	Tim Salditt (tutorial) :  X-ray diffuse scattering

9:15 - 9:30     BREAK

9:30	Neumann: X-ray magnetic circulr dichrosim studies from modulated specular reflectivity
9:50	Beck: Structural characterization of duried delta layers in Si(100) by non-specular reflectivity and reciprocal space mapping
10:10	Grim: Diffuse reflectivity of strain compensated Si/SiGe multilayers
10:30	Valvoda: Quantitative comparison of structural parameters of magnetic multilayers obtained by diffraction methods and by direct imaging techniques

10:50 - 11:10     BREAK

11:10	Veldkamp: Two dimensional scanning diffractometry for gradient optics investigation
11:30	Loehmann: Structure of sputtered molybdenum in single layers and multilayers with silicon
11:50	Grenzer: High-resolution XRD and X-ray diffuse scattering from semiconductor multilayers
12:10	Bak-Misiuk: Influence of hydrostatic pressure on transformation AlGaAs/GaAs interface
12.30	Domagala: Methodology of lattice parameter measurements for bent crystals
13:00	LUNCH
15:30	Sergey Stepanov (tutorial) :  X-ray grazing incidence diffraction

16:15 - 16:30     BREAK

16:30	Ulyanenkov: Grazing incidence x-ray diffraction from multilayers in view of diffuse scattering from rough interfaces
16:50	Sauer: Ti diffusion in LiNbO3 characterized by useing X-ray grazing incidence diffraction
17:10	Kovats: Huang scattering under grazing incidence from pseudomorphic SiC layers on Si
17:50	Kondrashkina: High-resolution diffraction and grazing incidence X-ray scattering from InGaP/GaAs multilayers
18:10	Fanchenko: Some aspects of grazing-incidence diffraction from crystals inhomogeneous films
18:30	Clarke: Asymmetries in grazing incidence diffuse X-ray scattering
18:50	Schroer: Three beam interferences on layered systems
20:00	FIRE PARTY

Saturday 4. 10. 1997

7:45	BREAKFAST
8:30	Tilo Baumbach (tutorial) :  X-ray diffraction from structurized surfaces

9:15 - 9:30     BREAK

9:30	Mikulik: X-ray reflectivity from multilayer gratings
9:50	Zhuang: Diffraction and reflectivity studies on Si/SiGe reactive ion etched periodic wire and dot structures
10:10	Darhuber: X-ray diffraction and reflection from self assembeled quantum dots
10:30	Luebbert: Determination of relaxation effects in semiconductor heterostructures by X-ray grazing incidence diffraction

10:50 - 11:10     BREAK

11:10	Ponti: Strain investigation in semiconductor epitaxial lateral structures
11:30	Darowski: X-ray grazing incidence diffraction from buried quantum wires
11:50	Wiebach: Strain in Si(1-x)Gex islands on silicon investigated by x-ray diffraction
12:10	Kharchenko: Influence of secondary extinction on X-ray diffraction from nonuniform crystals with microdefects
12:30	Sozonov: Photoemmission excited by the interference X-ray wave field for structural characterization of surface layers and thin films
13:00	LUNCH

END OF THE MEETING