The 4th Autumn School of
X-ray Scattering from Surfaces and Thin Layers

22. - 25. September 1999
Smolenice castle, Slovakia

Program of the school:

Wednesday 22. 9. 1999

8:30 Bus departure from Bratislava Main Railway Station
13:00 Lunch
14.00 M. Tolan (tutorial): X-ray reflectivity from surfaces and thin films
15:00 Coffee break
15:30 Aspelmeyer: Martensitic transformations at surfaces...
15:50 Eisenschmidt: Investigation of SrBi Tantalate layers on Si
16:10 Ulyanenkov: X-ray scattering study of interfacial roughness correlation
16:30 Short break
16:40 Anopchenko: Structure-GMR relationship Ag/Co multilayers
17:00 Meduna: Diffuse X-ray reflection from SiGe/Si
17:20 Hecker: Effect of annealing on structural properties of sputtered metallic multilayers
17:40 Novikova: Characterization of small d-space multilayers...
17:50 Hanke: X-ray scattering from steps and step bunches on homoepitaxial...
18:30 Dinner
20:00 Tower party

Thursday 23. 9. 1999

8:30 T. Baumbach (tutorial): X-ray scattering from lateral nanostructures
9:00 Coffee break
10:00 Schmidtbauer: Correlation in self-assembled SiGe nanscale islands
10:20 Wiebach: Combinded FEM and Brute Force Simulations of X-ray scattering in Epitaxial Nanostructures
10:40 Darowski: HRXRD and GID of lateral wire structures
11:00 Break
11:10 Zeimer: GID and PL analysis of strain modulated quantum well nanostructures
11:30 Zhuang: HRD and GID from from etched Nanostructures
11:50 Mikulik: Coplanar and Noncoplanar X-ray reflectivity from lateral W/Si multilayer gratings
12:10 Roch: Characterization of SiGe/Si self-organized QD by HRXRD
13:00 Lunch
15:00 A. Schreyer (tutorial): X-ray and neutron scattering from thin film systems
16:00 Coffee break
16:30 Bardosova: X-ray diffraction from thin organic multilayers
17:00 Poloucek : structure analysis of Lipid-polyelectrolyte LB-Films
17:20 Mueller: Thermal denaturating of bacteriorhodopsin....
17:40 Basu: X-ray scattering of soft matter films
18:10 Kharchenko: X-ray scattering from from spun LC-films...
18:30 Dinner
20:00 Ress (Bruker-AXS) and Kunath (Philips Industrial Electronics): Commercial presentations
21:00 Beer and wine discussion

Friday 24. 9. 1999

8:30 C. Ferrari (tutorial): Methods of strain determination in partially relaxed heterostructures
9:00 Coffee break
10:00 Bdikin: Domain structure of Yba2Cu3O7-x epitaxial thin films
10:20 Mazur: Lateral ordering in hetroepitaxial layers by HXRD
10:40 Nesterets: Investigation of semiconductor superlattices and graded layers using statistical theory of the triple crystal diffractometry
10:00 Break
11:10 Luebbert: X-ray methods to determine strain fields in semiconductor structures
11:30 Grenzer: GID strain analysis of GaAs after laterally modulated ion implantation
11:50 Daniel: Anisotropic strain relaxation in...
13:00 Lunch
15:00 H. Reichert (tutorial): X-ray diffuse scattering
16:00 Coffee break
16:30 Borowski: Orthorhombic microdifects in GaAs
16:50 Eichhorn: Thin layer studies at the material research Goniometer ROBL
17:10 Pfeiffer, F.: Thin film X-ray wave guides
17:30 Break
17:30 Pfeiffer, J.: Nucleation propagation of misfit dislocations
17:50 Makarov: Polishing of SiOx wafers
18:10 Streitel / Renner
18:30 Dinner
Fire, barbecue

Saturday 25. 9. 1999

7:30 Breakfast
8:30 Hiking tour
11:30 Lunch, departure

Last change: 27. 8. 1999