Publications in 1994
- Koppensteiner, E. - Holý, Václav. Analysis of strain and mosaicity in a short-period Si 9 Ge 6 superlattice by x-ray diffraction. Appl. Phys. Lett., USA : Institute of Physics, 64, 2s. 172-174. ISSN 0003-6951. 1994,. info
- Holý, Václav. Diffuse x-ray scattering from non-ideal periodical crystalline multilayers. Appl. Phys. A, 58(1994), -s. 173-180. 1994,. info
- Koppensteiner, E. - Holý, Václav. Diffuse x-ray scattering from p+ porous silicon by triple axis diffractometry. Appl. Phys. Lett., USA : Institute of Physics, 65, 12s. 1504-1506. ISSN 0003-6951. 1994,. info
- Holý, Václav - Kuběna, Josef. Effect of interfacial-roughness replication on the diffuse x-ray reflection from periodical multilayers. Appl. Phys. A, 60, -s. 93-96. 1994,. info
- Munzar, Dominik - Christensen, Niels Egede. Electronic structure of Sn/Ge superlattices. Physical Review B, USA : The American Physical Society, 49(1994), 16s. 11238-11484. ISSN 0163-1829. 1994,. info
- Humlíček, Josef - Thomsen, C. - Cardona, M. Far-infrared response of free carriers in YBA 2 Cu 3 O 7 from ellipsometric measurements. Physica C, Holland : Elsevier, 222, 1s. 166-172. ISSN 0921-4534. 1994,. info
- Munzar, Dominik - Bočánek, Luděk - Humlíček, Josef - Ploog, K. Fractal structure in optical spectra of Fibonacci superlattices. J.Phys.: Condens. Matter, Velká Britanie : IOP Publishing Ltd, 6(1994), -s. 4107-4118. ISSN 0953-8984. 1994,. info
- Koppensteiner, E. - Holý, Václav. High resolution x-ray triple axis diffractometry of short period Si m Ge n superlattices. Jpn. J. Appl. Phys., 33, 4Bs. 2322-2328. 1994,. info
- Ohlídal, Ivan - Navrátil, Karel. Characterization of the basic statistical properties of very rough surfaces of transparent solids by immersion shearing interferometry. Applied Optics, USA : Optical Society of America, 33(1994), 34s. 7838-7945. ISSN 0003-6935. 1994,. info
- Kučírková, Assja - Navrátil, Karel. Interpretation of infrared transmittance spectra of SiO 2 thin films. Applied Spectroscopy, USA : Society Appl. Spectroscopy, 48(1994), 1s. 113-120. ISSN 0003-7028. 1994,. info
- Holý, Václav. Nonspecular x-ray reflection from rough multilayers. Physical Review B, USA : The American Physical Society, 49, 15s. 10668-10743. ISSN 0163-1829. 1994,. info
- Koppensteiner, E. - Holý, Václav. Quantitative analysis of strain relaxation and mosaicity in short period Si m Ge n superlattices using reciprocal space mapping by x-ray diffraction. Solid-State Electronics, 37, 4-6s. 629-634. 1994,. info
- Líbezný, Milan - Caymax, M. - Brablec, Antonín - Kuběna, Josef - Holý, Václav. Spektrální elipsometrická charakterizace tenkých epitaxních vrstev Si_(1-x)Ge_x. In 1st Int. Conf. on Materials for Microelectronics. Barcelona : University of Barcelona, 1994,. s. 23-27. info
- Lang, M. - Holý, Václav. Structural properties of perfect ZnTe epilayers on (001) GaAs substrates. Journal of Crystal Growth, 138, -s. 81-85. 1994,. info
- Baumbach, G.T. - Holý, Václav. The influence of specular interface reflection on grazing incidence x-ray diffraction and diffuse scattering from superlattices. Physica B, 198, -s. 249-252. 1994,. info
- Vávra, I. - Holý, Václav - Kuběna, Josef. The influence of thermal processing on structural and electrical properties of Wx Si 1-x/Si multilayers. Nuclear Instruments & Methods in Physics Research A, 350, -s. 379-390. 1994,. info
- Humlíček, Josef. Transverse and longitudinal vibration modes in alpha-quartz. Philosophical Magazine B, Taylor and Francis, 70(1994), 3s. 699-710. 1994,. info
- Kučírková, Assja - Navrátil, Karel. Undesirable Occurrence of the Interference Fringes in IR Transmittance Spectra. Scripta Fac.Brun., 29(1994), 1, od s. -, - s. ISSN 2101-2986. 1994,. info
- Plotz, W. - Holý, Václav. X-ray characterization of semiconductor surfaces and interfaces. J. Phys. III France 4, 1994, -s. 1565-1571. 1994,. info
- Holý, Václav. X-ray triple-cristal diffractometry of defects in epitaxic layers. J. Appl. Cryst., 27, -s. 551-557. 1994,. info
Output from Information System of the Masaryk University filtered for the following staff of the Institute: Luděk Bočánek, Ondřej Caha, Jan Celý, Adam Dubroka, Jan Fikar, Olga Fikarová Zrzavecká, Jan Hlávka, Václav Holý, Jaroslav Hora, Josef Humlíček, Jiří Chaloupka, Pavel Klang, Jan Krčmář, Vlastimil Křápek, Josef Kuběna, Assja Kučírková, Michal Lorenc, Jiří Marek, Přemysl Maršík, Mojmír Meduňa, Petr Mikulík, Dominik Munzar, Karel Navrátil, Alois Nebojsa, Jiří Novák, Petr Pánek, Radek Pavelka, Pavel Polouček, Eduard Schmidt, Jan Šik, Richard Štoudek, Radoslav Švehla