UFKL
pevné látky   biofyzika                 
Náš ústav se účastní projektu

CEITEC

Středoevropský technologický institut
  Ústavy fyziky jsou součástí Přírodovědecké fakulty Masarykovy univerzity v Brně. Cesky   English  

Publications in 1998

  1. Ohlídal, Ivan - Franta, Daniel - Hora, Jaroslav - Navrátil, Karel - Weber, Jan - Janda, Pavel. Analysis of thin films with slightly rough boundaries. Mikrochim. Acta, Wien : Springer-Verlag, Suppl. 15, 1s. 177-180. ISSN 0026-3672. 1998,. URL info

  2. Munzar, Dominik - Dobročka, E. - Vávra, I. - Kúdela, R. - Harvanka, M. - Christensen, N.E. Antiphasing mechanism of ordered Ga 0.5 In 0.5 P layers grown on GaAs (001). Physical Review B, USA : The American Physical Society, 57(1998), 8s. 4642-4648. ISSN 0163-1829. 1998,. info

  3. Strohm, T. - Munzar, Dominik - Cardona, D. Comment on Screening of the B1g raman response in d-wave seperconductors. Physical Review B, USA : The American Physical Society, (58)1998, -s. 8839-8840. ISSN 0163-1829. 1998,. info

  4. Holý, Václav - Darhuber, A.A. - Stangl, J. - Zerlauth, S. - Schaffer, F. - Bauer, G. - Darowski, N. - Lubbert, D. - Pietsch, U. Coplanar and grazing incidence x-ray diffraction investigation of self-organized SiGe quantum dot multilayers. Physical Review B, USA : The American Physical Society, (58)1998, 12s. 7934-7943. ISSN 0163-1829. 1998,. info

  5. Šikola, T. - Spousta, J. - Češka, R. - Zlámal, J. - Dittrichová, L. - Nebojsa, Alois - Navrátil, Karel - Rafaja, D. - Zemek, J. - Peřina, V. Deposition of metal nitrides by IBAD. Surface & coatings technology, Elsevier Science, 1998, 108-109s. 284-291. ISSN 0257-8972. 1998,. info

  6. Kučírková, Assja - Navrátil, Karel - Zemek, J. Depth inhomogeneity of deposited thin films: application to semi-insulating polycrystalline silicon films. Thin Solid Films, UK Oxford : Elsevier science, (323)1998, -s. 53-58. ISSN 0040-6090. 1998,. info

  7. Humlíček, Josef. Ellipsometric study of fano resonance in heavily doped p-type Si and SiGe alloys. Thin Solid Films, UK Oxford : Elsevier science, 1998, 313-314s. 656-660. ISSN 0040-6090. 1998,. info

  8. Humlíček, Josef - Nebojsa, Alois - Hora, J. - Stráský, M. - Spousta, J. - Šikola, T. Ellipsometry and transport studies of thin-film metal nitrides. Thin Solid Films, UK Oxford : Elsevier science, 1998, 332s. 25-29. ISSN 0040-6090. 1998,. info

  9. Darhuber, A.A. - Holý, Václav - Stangl, J. - Mikulík, Petr - Brunner, K. - Abstreiter, G. - Bauer, G. Highly regular self-organization of step bunches during growth of SiGe on Si(113). Appl. Phys. Lett., USA : Institute of Physics, 73(1998), -s. 1535-1537. ISSN 0003-6951. 1998,. info

  10. Stangl, J. - Darhuber, A.A. - Holý, Václav - de Naurois, M. - Ferreira, S. - Faschinger, W. - Bauer, G. High-resolutin x-ray diffraction and x-ray reflectivity studies of short-period CdTe/MnTe-superlattices. Journal of crystal growth, Amsterdam : Elsevier Science, 1998, 184/185s. 105-108. ISSN 0022-0248. 1998,. info

  11. Holý, Václav - Pietsch, U. - Baumbach, T. High-resolution x-ray scattering from thin films and multilayers. Germany Berlin : High-resolution x-ray scattering from thin films and multilayers, 1998,. 256 s. Springer Tracts in Modern Physics. ISBN 3-540-62029-X. info

  12. Jergel, M. - Majková, E. - Luby, S. - Senderák, R. - Holý, Václav. Characterization of surfaces and interfaces by hard x-ray reflectometry and diffuse scattering at grazing incidence. Acta Physica Slovaca, Slovakia, 1998, 48s. 427-440. ISSN 0323-0465. 1998,. info

  13. Humlíček, Josef. Infrared ellipsometry of LiF. Thin Solid Films, UK Oxford : Elsevier science, 1998, 313-314s. 687-691. ISSN 0040-6090. 1998,. info

  14. Lorenc, Michal - Humlíček, Josef. Localized vibrational modes of interstitial oxygen in Si x Ge 1-x alloys. Acta physica polonica A, Jaszowiec Polsko : Intern.School on Physics of Semicond.Com, 1998, 3s. 436-441. 1998,. info

  15. Holý, Václav - Darhuber, A.A. - Stangl, J. - Bauer, G. - Nuetzel, J. - Abstreiter, G. Oblique roughness replication in strained SiGe/Si multilayers. Physical Review B, USA : The American Physical Society, (57)1998, 19s. 12435-12442. ISSN 0163-1829. 1998,. info

  16. Šik, Jan - Hora, Jaroslav - Humlíček, Josef. Optical functions of silicon at high temperatures. Journal of Applied Physics, USA : American institute of physics, 1998, 11s. 6291-6298. ISSN 0021-8979. 1998,. info

  17. Pavelka, Radek - Hlávka, Jan - Ohlídal, Ivan - Sitter, Helmut. Optical parameter analysis of thin absorbing films measured by the photovoltage method. Acta physica polonica A, Jaszowiec, Polsko : Intern.School on Physics of Semicond.Com, 94, 3s. 468-472. 1998,. info

  18. Franta, Daniel - Ohlídal, Ivan - Munzar, Dominik. Parameterisation of the model of dispersion dependences of solid state optical constants. Acta Physica Slovaca, Bratislava : Institute of Physics, SAS, 48, 4s. 451-458. ISSN 0323-0465. 1998,. URL info

  19. Springholz, G. - Holý, Václav - Pinczolits, M. - Bauer, G. Self-organized growth of three-dimensional quantum-dot crystals with fcc-like stacking and a tunable lattice constant. Physical Review Letters, USA : The Americal Physical Society, 282(1998), 23s. 734-737. ISSN 0031-9007. 1998,. info

  20. Humlíček, Josef. Silicon-germanium alloys (Si x Ge 1-x) revisited. In Handbook of optical Constants of solids III. 1. vyd. USA : Academic Press, 1998,. s. 537-552. ISBN 0-12-544423-0. info

  21. Bortchagovsky, E. - Yurchenko, I. - Kazantseva, Z. - Humlíček, Josef - Hora, J. Spectroscopic ellipsometry of fullerene embedded langmuir-blodgett films with surface plasmon excitation. Thin Solid Films, UK Oxford : Elsevier science, 1998, 313-314s. 795-798. ISSN 0040-6090. 1998,. info

  22. Li, J.H. - Springholz, G. - Stangl, G. - Seyringer, H. - Holý, Václav - Schaffler, F. - Bauer, G. Strain relaxation and surface morphology of compositionally graded Si/SiGe buffers. J. Vac. Sci & Technol., 1998, B16s. 1610-1615. 1998,. info

  23. Darhuber, A.A. - Holý, Václav - Schittenhelm, P. - Stangl, J. - Kegel, I. - Kovats, Z. - Metzger, T.H. - Bauer, G. - Abstreiter, G. - Gruebel, G. Structural characterization of self-assembled Ge dot multilayers by x-ray diffraction and reflectivity methods. Physica E 2, Amsterdam, 1998, -s. 789-793. ISSN 1386-9477. 1998,. info

  24. Mikulík, Petr - Baumbach, Tilo. X-ray reflection by multilayer surface gratings. Physica B condensed matter, Amsterdam, 248, 9999s. 381-386. ISSN 0921-4526. 1998,. URL info

  25. Holý, Václav - Darhuber, A.A. - Stangl, J. - Bauer, G. - Nutzel, J. - Abstreiter, G. X-ray reflectivity investigations of the interface morphology in strained SiGe/Si multilayers. Semicond. Sci. Technol., UK : Publishing Ltd, 13(1998), -s. 590-598. ISSN 0268-1242. 1998,. info

  26. Jergel, M. - Holý, Václav - Majková, E. - Luby, S. - Senderák, R. - Stock, H.J. - Menke, D. - Kleineberg, U. - Heinzmann, U. X-ray scattering study of interface roughness correlation in Mo/Si and Ti/C multilayers for X-UV optics. Physica B condensed matter, Amsterdam : Elsevier Science, 253(1998), -s. 28-39. ISSN 0921-4526. 1998,. info

Output from Information System of the Masaryk University filtered for the following staff of the Institute: Luděk Bočánek, Ondřej Caha, Jan Celý, Adam Dubroka, Jan Fikar, Olga Fikarová Zrzavecká, Jan Hlávka, Václav Holý, Jaroslav Hora, Josef Humlíček, Jiří Chaloupka, Pavel Klang, Jan Krčmář, Vlastimil Křápek, Josef Kuběna, Assja Kučírková, Michal Lorenc, Jiří Marek, Přemysl Maršík, Mojmír Meduňa, Petr Mikulík, Dominik Munzar, Karel Navrátil, Alois Nebojsa, Jiří Novák, Petr Pánek, Radek Pavelka, Pavel Polouček, Eduard Schmidt, Jan Šik, Richard Štoudek, Radoslav Švehla  

(c) Ústav fyziky kondenzovaných látek                             publ-year-1998.shtml změněn 04.12.2006