Seminar DPE: Prof. Jiří Spousta

We cordially invite you to the lecture of Prof. Jiří Spousta from the Institute of Physical Engineering, Faculty of Mechanical Engineering, BUT Brno.

Development of multifunctional AFM tips of new generations - preparation and characterization of surfaces and nanostructures simultaneously observed in the electron microscope and by scanning probe SPM (CPEM)​

In our world, nanotechnologies play a more and more critical role. More efforts are put into preparing and characterizing nanotechnologies from big technological companies, high-end ones, and researchers worldwide. At the Institute of Physical Engineering, a spin-off company Nenovision was founded. Nenovision company deals with developing and manufacturing LiteScope microscopes for correlative imaging of sample surfaces using Scanning Probe Microscopy (SPM) and electron beam (SEM).

New multifunctional probes will be presented in the lecture. They widen the application of the device from the characterization of nanostructures (surface topography, local conductivity of the sample, magnetic properties, and others) to preparation and modification. The newly developed probes and based on the application of hollow optical fibers that allow the insertion of light, gas, or voltage under the AFM tip in the electron microscope chamber. It is a way to highly increase the usability of probes, as will be presented during the lecture.​