Mgr. Ondřej Caha, Ph.D.
| E‑mail: |
|
|---|
Experience in broad range of X-ray methods. Enjoys self-made assemblying of instrumentation.
prof. RNDr. Václav Holý, CSc.
| E‑mail: |
|
|---|
The longest experience in X-ray methods and solid states physics. Editor of the Journal of Applied Crystallography.
Mgr. Mojmír Meduňa, Ph.D.
| E‑mail: |
|
|---|
Experience in broad range of X-ray techniques. In recent years more focused on (submicron) diffraction experiments at synchrotrons, 3D reciprocal space mapping, X-ray reflectometry surface morphology and defects in semiconductor monocrystals.
doc. RNDr. Petr Mikulík, Ph.D.
| E‑mail: |
|
|---|
Experience in X-ray reflectometry, transmission X-ray imaging (radiography, (micro)CT, phase contrast imaging), X-ray diffraction imaging (rocking curve imaging, area diffractometry) and simulation of X-ray optics.
Mgr. Jiří Novák, Ph.D.
| E‑mail: |
|
|---|
Focuses mainly on growth and structural characterization of thin films of functional molecules (e.g. organic semiconductors and molecular nano-magnets) and nano-particles. The main topics are phase transformations, phase nucleation, formation of molecular binary mixtures, organic-inorganic hybrid films, and kinetics of thin film growth. Here, most of the experiments are performed in-situ during annealing or sample cooling or in real-time during thin film growth. Techniques utilized in this research include X-ray reflectivity, grazing incidence X-ray diffraction and small angle scattering (GIXD and GISAXS), X-ray small angle scattering (SAXS), and pole-figures measurements. Jiri and his collaborators put also large effort into finding relations between structural and optical or electric properties of studied materials.