Seminář ÚFKL: Jan Čechal

Ústav fyziky kondenzovaných látek vás zve na přednášku

Jan Čechal (CEITEC Vysoké učení technické v Brně a Fakulta strojního inženýrství, VUT):
Low Energy Electron Microscopy as a Tool for Surface Science

Low Energy Electron Microscopy allows real-time imaging of surfaces on a micrometer scale with sub-10 nm resolution. In the seminar talk, I will introduce the capabilities of the technique on several examples from our laboratory. Bright-field imaging and diffraction will be demonstrated on real-time imaging of the transformation of molecular phases of 4,4′-biphenyl dicarboxylic acid (BDA) and determination of their structure by local congruence method, respectively. Graphene on SiC and FeSe on Bi2Se3 will serve as systems for demonstrating I-V analysis and dark-field imaging. Finally, I will present an electron-beam-induced reaction that can be induced and followed by LEEM. ​​